
Researcher, Consultant, and Photographer
Greater New York City Area

Researcher, Consultant, and Photographer
Greater New York City Area
1 more...
Expert in test, debug, reconfigurable computing, silicon validation, IC security, fault-tolerance, FPGAs, diagnosis, and EDA. IEEE Fellow. Co-author of "Digital System Testing and Testable Design" adopted world-wide as standard graduate textbook. Co-founder and Chief Technology Officer at DAFCA, Inc. Prior experience includes 22 years with Bell Labs and 5 years with the the Weizmann Inst. of Science.
I am also a freelance photographer - see My Porfolio above or go to Miron PhotoArt http://mironab.redbubble.com
infrastructure IP, silicon validation and debug, test and diagnosis, IC security, fault tolerance, EDA, art photography
IEEE Fellow